Texas Instruments TPS7H6023EVM-CVAL Driver Evaluation Module
Texas Instruments TPS7H6023EVM-CVAL Driver Evaluation Module (EVM) is designed to test and evaluate the TPS7H6023-SP. The TPS7H6023-SP is a radiation-hardened 22V half-bridge GaN gate driver. The board accepts up to a 14V input and allows designers to test the reliability of the TPS7H6023-SP by driving a gallium-nitride (GaN) FET. By default, the evaluation module is set up to run with the PWM mode of Texas Instruments TPS7H6023-SP, which accepts an input of one switching signal and internally generates a complementary signal.
Features
- Selectable input interlock protection in independent input mode
- Split outputs for adjustable turn-on and turn-off times
- 25ns typical propagation delay in independent input mode
- 1.5A peak source, 3A peak sink current
Applications
- Communications payload
- Space satellite point of load supply for FPGA core voltage rails
- Command and data handling
- Satellite electrical power system
Associated EVMs
Texas Instruments TPS7H60x5EVM Evaluation Modules
Designed to quickly and easily demonstrate the TPS7H60x5-SEP gate drivers.
Texas Instruments TPS7H6013EVM-CVAL Gate Driver Evaluation Module
Evaluates the TPS7H6013-SP device, a radiation-hardened, QMLV 60V half-bridge GaN gate driver.
Texas Instruments TPS7H6003EVM-CVAL Evaluation Module
Accepts up to a 150V input to test the reliability of the TPS7H6003-SP by driving the EPC2307.
Publicado: 2024-06-13
| Actualizado: 2025-02-27